DocumentCode
2264966
Title
A novel scheme for optimal edge detection and generic recognition
Author
Ben-Arie, Jezekiel ; Rao, K. Raghunath
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fYear
1993
fDate
16-18 Aug 1993
Firstpage
907
Abstract
Expansion matching is a template recognition scheme which optimizes a new similarity measure called Discriminative Signal to Noise Ratio (DSNR) and has been shown to robustly recognize templates under conditions of noise, severe occlusion and superposition. The DSNR criterion is better suited to practical conditions than the traditional SNR since it considers as “noise”, even the off-center response of the filter to the signal itself. We have also recently extended the expansion filter to simultaneously recognize multiple templates while optimizing the DSNR. In this paper we introduce a new family of optimal DSNR edge detectors based on the expansion filter for several edge models. The step edge detector is compared with the widely used Canny Edge Detector (CED). Experimental comparisons show that our edge detector is superior to the CED in terms of DSNR even under very noisy signal conditions. We also use the optimal DSNR multiple template expansion filter for generic recognition of faces. We create a “generic face” filter by requiring the designed filter to elicit equal responses to all the training faces while optimizing DSNR
Keywords
edge detection; face recognition; image matching; noise; optimisation; canny edge detector; discriminative SNR; discriminative signal to noise ratio; expansion filter; expansion matching; face recognition; generic recognition; multiple templates; optimal DSNR edge detectors; optimal edge detection; step edge detector; template recognition scheme; Additive noise; Detectors; Fourier transforms; Frequency domain analysis; Image edge detection; Integrated circuit noise; Noise level; Shape; Testing; Wiener filter;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on
Conference_Location
Detroit, MI
Print_ISBN
0-7803-1760-2
Type
conf
DOI
10.1109/MWSCAS.1993.343215
Filename
343215
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