Title :
SVM Classifier for Analog Fault Diagnosis Using Fractal Features
Author :
Mao, Xianbai ; Wang, Liheng ; Changxi Li
Author_Institution :
Dept. of Control Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan
Abstract :
Support Vector Machine (SVM) has advantages of strong generalization ability simple architecture as well as classification ability to a few samples. Fractal dimension can quantitatively describe the non-linear behavior of vibration signal and can be used as features for fault diagnosis. Combining SVM and fractal theory, a novel fault diagnosis method for analog circuits based on SVM using fractal dimension is developed in this paper. Firstly, output voltage signals are obtained from circuit under test (CUT) and corresponding fractal gridding dimensions are calculated which constitutes the fault feature vectors; Subsequently, after training the SVM by faulty feature vectors, the SVM model of the circuit fault diagnosis system is built; Finally, the trained SVM classifier and is used to recognize and classify the unknown faults. Simulation results of diagnosing the Sallen-Key band pass filter circuit have confirmed that the proposed approach increases the fault diagnosis accuracy, thereby it may be considered as an alternative for the analog fault diagnosis.
Keywords :
analogue circuits; band-pass filters; circuit testing; electronic engineering computing; fault diagnosis; support vector machines; SVM classifier; Sallen-Key band pass filter circuit; analog circuits; analog fault diagnosis; circuit under test; fractal features; fractal gridding dimensions; fractal theory; generalization ability; support vector machine; vibration signal; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Fractals; Support vector machine classification; Support vector machines; System testing; Voltage;
Conference_Titel :
Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3497-8
DOI :
10.1109/IITA.2008.249