DocumentCode
2265093
Title
SVM Classifier for Analog Fault Diagnosis Using Fractal Features
Author
Mao, Xianbai ; Wang, Liheng ; Changxi Li
Author_Institution
Dept. of Control Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan
Volume
2
fYear
2008
fDate
20-22 Dec. 2008
Firstpage
553
Lastpage
557
Abstract
Support Vector Machine (SVM) has advantages of strong generalization ability simple architecture as well as classification ability to a few samples. Fractal dimension can quantitatively describe the non-linear behavior of vibration signal and can be used as features for fault diagnosis. Combining SVM and fractal theory, a novel fault diagnosis method for analog circuits based on SVM using fractal dimension is developed in this paper. Firstly, output voltage signals are obtained from circuit under test (CUT) and corresponding fractal gridding dimensions are calculated which constitutes the fault feature vectors; Subsequently, after training the SVM by faulty feature vectors, the SVM model of the circuit fault diagnosis system is built; Finally, the trained SVM classifier and is used to recognize and classify the unknown faults. Simulation results of diagnosing the Sallen-Key band pass filter circuit have confirmed that the proposed approach increases the fault diagnosis accuracy, thereby it may be considered as an alternative for the analog fault diagnosis.
Keywords
analogue circuits; band-pass filters; circuit testing; electronic engineering computing; fault diagnosis; support vector machines; SVM classifier; Sallen-Key band pass filter circuit; analog circuits; analog fault diagnosis; circuit under test; fractal features; fractal gridding dimensions; fractal theory; generalization ability; support vector machine; vibration signal; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Fractals; Support vector machine classification; Support vector machines; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
Conference_Location
Shanghai
Print_ISBN
978-0-7695-3497-8
Type
conf
DOI
10.1109/IITA.2008.249
Filename
4739825
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