Title :
On-line monitoring of Random Number Generators for embedded security
Author :
Santoro, Renaud ; Sentieys, Olivier ; Roy, Sébastien
Author_Institution :
IRISA, Univ. of Rennes, Lannion, France
Abstract :
Many embedded security chips require a high-quality random number generator (RNG). Unfortunately, hardware RNG randomness can vary in time due to implementation defects or certain kinds of attacks. To overcome this issue, this paper presents the implementation of a battery of statistical test for randomness. The battery is selected for its efficient implementation, making the area and power consumption insignificant. Performance and cost of the hardware implementation are given for FPGA and VLSI targets. Results show that statistical tests can easily be implemented in low-cost embedded security circuits and can enhance on-line monitoring of RNG randomness to prevent RNG failures.
Keywords :
VLSI; computerised monitoring; field programmable gate arrays; random number generation; random processes; security of data; statistical testing; FPGA; VLSI targets; embedded security; online monitoring; power consumption; random number generators; statistical test; Batteries; Circuit testing; Costs; Energy consumption; Field programmable gate arrays; Hardware; Monitoring; Random number generation; Security; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3827-3
Electronic_ISBN :
978-1-4244-3828-0
DOI :
10.1109/ISCAS.2009.5118446
