• DocumentCode
    2265957
  • Title

    Quantitative analysis of information security interdependency between industrial sectors

  • Author

    Tanaka, Hideyuki

  • Author_Institution
    Univ. of Tokyo, Tokyo, Japan
  • fYear
    2009
  • fDate
    15-16 Oct. 2009
  • Firstpage
    574
  • Lastpage
    583
  • Abstract
    This paper employs Input-Output analysis to quantitatively analyze cross-sectoral security interdependency in terms of economic activity. Previous studies using the Inoperability Input-Output Model (IIM) have demonstrated the impact of cross-sectoral security incidents from the viewpoint of interdependency. However, the two primary limitations of these studies are that (1) they do not consider each sector´s features in terms of information technology (IT) and information security (IS), and (2) they focus on the damage caused by IS incidents to sectors and do not consider the level of security interdependency itself. The author proposes a practical methodology to measure sectoral IS interdependency by introducing forward linkage and backward linkage analyses into an IIM. The methodology assesses the dependency of each sector with respect to IT and the level of IS measures. Furthermore, the paper applies the methodology to recent statistical economic data of Japanese industrial sectors and illustrates the implications of cross-sectoral security interdependency.
  • Keywords
    industrial economics; manufacturing industries; security of data; statistical analysis; IIM; Japanese industrial sector; cross-sectoral information security interdependency; economic activity; forward-backward linkage analysis; information technology; inoperability input-output model analysis; statistical economic data; Business; Computer industry; Data security; Economic forecasting; Information analysis; Information security; Information technology; Macroeconomics; Software engineering; Software measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Empirical Software Engineering and Measurement, 2009. ESEM 2009. 3rd International Symposium on
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    1938-6451
  • Print_ISBN
    978-1-4244-4842-5
  • Electronic_ISBN
    1938-6451
  • Type

    conf

  • DOI
    10.1109/ESEM.2009.5314218
  • Filename
    5314218