DocumentCode :
2266066
Title :
Tactical advanced process control
Author :
Jensen, Carlos ; Do, D.
fYear :
2003
fDate :
30 Sept.-2 Oct. 2003
Firstpage :
358
Lastpage :
361
Abstract :
To reduce implementation costs, maximize flexibility, and better manage intellectual property associated with Advanced Process Control (APC) systems, we present our experiences with tactical APC (TAPC) applications built upon established in-house tool automation, measurement collection, statistical process control (SPC), and process recipe management. TAPC includes process and software engineers, and a quality assurance statistician, focused on developing control algorithms capable of maintaining efficiency in process recipes.
Keywords :
industrial property; integrated circuit manufacture; quality control; statistical process control; SPC; advanced process control; control algorithms; measurement collection; process recipe management; statistical process control; tool automation; Application software; Automatic control; Automation; Costs; Intellectual property; Maintenance engineering; Process control; Quality assurance; Software maintenance; Software quality;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 2003 IEEE International Symposium on
ISSN :
1523-553X
Print_ISBN :
0-7803-7894-6
Type :
conf
DOI :
10.1109/ISSM.2003.1243301
Filename :
1243301
Link To Document :
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