• DocumentCode
    22662
  • Title

    Experimental Characterization of Electro–Thermo–Mechanical Coupling in Gold RF Microswitches

  • Author

    Brusa, Eugenio ; De Pasquale, G. ; Soma, A.

  • Author_Institution
    Dept. of Mech. & Aerosp. Eng., Politec. di Torino, Turin, Italy
  • Volume
    22
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    919
  • Lastpage
    929
  • Abstract
    This paper analyses the multiple coupling occurring in some metallic microstructures electrostatically actuated in presence of thermal effect. Some relevant issues of basic procedures implemented to identify the relevant design parameters and the material properties of micro-electro-mechanical systems (MEMS) are preliminarily discussed. Temperature effects on the MEMS strain distribution in operating conditions are then investigated. Thermo-mechanical coupling is studied through some experiments performed on microbridge prototypes electrostatically actuated by comparing their behavior in case of superposed electro-thermal actuation and of thermal loading without electrostatic coupling. A detailed analysis is here performed to evaluate the role of the thermal stress upon the buckling of the microstructure and its effect on the deformed shape of the microbeam. Electro-thermo-mechanical coupling is therefore modeled and experimentally analyzed. Pull-in tests are used to detect some effects of mutual interaction between temperature and electrical actuation. The methodologies, here proposed, apply to several materials used in microfabrication, although experimental evidence described herein concerns some gold microbridges to be included in RF devices.
  • Keywords
    buckling; electrostatic actuators; gold; microfabrication; microswitches; thermomechanical treatment; Au; MEMS strain distribution; buckling; deformed shape; electrical actuation; electrostatic actuator; electrostatic coupling; electrothermal actuation; electrothermomechanical coupling; gold RF microswitches; metallic microstructures; microbridge; microelectromechanical systems; microfabrication; pull-in tests; temperature actuation; thermal stress; Mechanical design; structural buckling; structural micromechatronics; thermal stresses; thermo-electro-mechanical coupling;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2013.2250486
  • Filename
    6502642