• DocumentCode
    2266315
  • Title

    A shallow trench isolation using novel polysilazane-based SOG for deep-submicron technologies and beyond

  • Author

    Jung-Ho Lee ; Dong-Jun Lee

  • fYear
    2003
  • fDate
    30 Sept.-2 Oct. 2003
  • Firstpage
    419
  • Lastpage
    422
  • Abstract
    A novel Spin-On-Glass (SOG), which is called polysilazane-based SOG (SZ-SOG), is shown to have the advantage of simple process, low moisture absorption and high throughput as well as provide excellent gap-fill ability. This material was successfully integrated in a STI layer of logic device without void formation and liner oxidation for the first time. This material shows no problem in view of material, physical integration and electrical requirements compared with the conventional HDP-CVD oxide process.
  • Keywords
    glass; isolation technology; logic devices; oxidation; polymers; spin coating; HDP-CVD oxide process; deep submicron technology; electrical requirements; liner oxidation; logic device; moisture absorption; polysilazane based SOG; shallow trench isolation; spin on glass; void formation; Bonding; Chemical processes; Etching; Isolation technology; Logic devices; Manufacturing; Moisture; Oxidation; Scanning electron microscopy; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2003 IEEE International Symposium on
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-7894-6
  • Type

    conf

  • DOI
    10.1109/ISSM.2003.1243316
  • Filename
    1243316