• DocumentCode
    2266390
  • Title

    Facial Expression Recognition Using Wavelet Transform and Neural Network Ensemble

  • Author

    Chen, Fengjun ; Wang, Zhiliang ; Xu, Zhengguang ; Xiao, Jiang ; Wang, Guojiang

  • Author_Institution
    Sch. of Inf. Eng., Univ. of Sci. & Technol. Beijing, Beijing
  • Volume
    2
  • fYear
    2008
  • fDate
    20-22 Dec. 2008
  • Firstpage
    871
  • Lastpage
    875
  • Abstract
    The paper presents a facial expression recognition approach based on wavelet transform features and neural network ensemble classifier for the six basic facial expressions from static images of the CMU-PITTSBURGH AU-Coded Face Expression Image Database. Because the facial expression information are mostly concentrate on facial expression information regions, so the mouth, eye and eyebrow regions are segmented from the facial expression images firstly. Then the low-dimension features using wavelet transform and Karhunen-Loeve transform are acquired. A neural network ensemble classifier based on Bagging is constructed finally. The proposed approach has demonstrated superior performance compared to neural networks. The neural network ensemble based classifier yielded an accuracy of 98.5%; the best accuracy obtained from all other neural network based classification schemes tested using the same database.
  • Keywords
    Karhunen-Loeve transforms; face recognition; neural nets; visual databases; wavelet transforms; CMU-PITTSBURGH AU-Coded Face Expression Image Database; Karhunen-Loeve transform; facial expression recognition; neural network; wavelet transform; Bagging; Eyebrows; Face recognition; Image databases; Image recognition; Image segmentation; Karhunen-Loeve transforms; Mouth; Neural networks; Wavelet transforms; artificial psychology; facial expression recognition; neural network ensemble; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3497-8
  • Type

    conf

  • DOI
    10.1109/IITA.2008.24
  • Filename
    4739888