Title :
Economics modelling for the determination of optimal known good die strategies
Author :
Dislis, C. ; Jalowiecki, I.P.
Author_Institution :
Dept. of Cybern., Reading Univ., UK
fDate :
31 Jan-2 Feb 1995
Abstract :
This paper describes an economics model based approach to determining optimal KGD strategies for multi-chip modules. The economics models are described, and a case study provided using reusable die carriers to facilitate die test and burn in. This is compared to a non-KGD approach in financial terms, using the models described
Keywords :
economics; integrated circuit manufacture; integrated circuit testing; multichip modules; production testing; MCM; burn in; die test; economics modelling; known good die; multi-chip modules; optimal KGD strategies; reusable die carriers; Aerospace electronics; Artificial satellites; Costs; Cybernetics; Economic forecasting; Mobile communication; Packaging; Power generation economics; Predictive models; Testing;
Conference_Titel :
Multi-Chip Module Conference, 1995. MCMC-95, Proceedings., 1995 IEEE
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-6970-5
DOI :
10.1109/MCMC.1995.511997
