DocumentCode
2266867
Title
Sparse learning approach to the problem of robust estimation of camera locations
Author
Dalalyan, Arnak ; Keriven, Renaud
Author_Institution
Ecole des Ponts ParisTech, Univ. Paris Est, Paris, France
fYear
2009
fDate
Sept. 27 2009-Oct. 4 2009
Firstpage
436
Lastpage
443
Abstract
In this paper, we propose a new approach-inspired by the recent advances in the theory of sparse learning-to the problem of estimating camera locations when the internal parameters and the orientations of the cameras are known. Our estimator is defined as a Bayesian maximum a posteriori with multivariate Laplace prior on the vector describing the outliers. This leads to an estimator in which the fidelity to the data is measured by the L¿-norm while the regularization is done by the L1-norm. Building on the papers [11, 15, 16, 14, 21, 22, 24, 18, 23] for L¿-norm minimization in multiview geometry and, on the other hand, on the papers [8, 4, 7, 2, 1, 3] for sparse recovery in statistical framework, we propose a two-step procedure which, at the first step, identifies and removes the outliers and, at the second step, estimates the unknown parameters by minimizing the L¿ cost function. Both steps are fairly fast: the outlier removal is done by solving one linear program (LP), while the final estimation is performed by a sequence of LPs. An important difference compared to many existing algorithms is that for our estimator it is not necessary to specify neither the number nor the proportion of the outliers.
Keywords
Laplace equations; belief networks; computer graphics; computer vision; estimation theory; statistical analysis; Bayesian maximum a posteriori; camera locations; linear program; multivariate Laplace; multiview geometry; robust estimation problem; sparse learning approach; statistical framework; Bayesian methods; Cameras; Computer vision; Cost function; Geometry; Inverse problems; Noise generators; Noise measurement; Parameter estimation; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
Conference_Location
Kyoto
Print_ISBN
978-1-4244-4442-7
Electronic_ISBN
978-1-4244-4441-0
Type
conf
DOI
10.1109/ICCVW.2009.5457669
Filename
5457669
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