• DocumentCode
    2266936
  • Title

    A study of material identification using SAR

  • Author

    Sotirelis, Paul ; Parker, Jason T. ; Fu, Michael ; Hu, Xueyu ; Albanese, Richard

  • Author_Institution
    US Air Force Res. Lab., Wright-Patterson AFB, OH, USA
  • fYear
    2012
  • fDate
    7-11 May 2012
  • Abstract
    We investigate the feasibility of using synthetic aperture radar (SAR) data to identify materials at each pixel in a SAR image. A fundamental concept underlying our approach is to extract the dispersion of the reflectivity at each pixel by dividing the data into several frequency sub-bands. We first compute synthetic radar data using parameters that are characteristic of a typical wide-band SAR system operating in a spotlight mode and illuminating several scattering regions that differ in their frequency response. Secondly, we process the data by subdividing the full data set into frequency sub-bands thereby extracting the dispersion at each pixel. Third and finally, we perform the material identification using a rudimentary classification analysis. The approach described herein offers a new method for planning experimental data collections for the purpose of material identification through SAR image formation.
  • Keywords
    synthetic aperture radar; SAR image formation; frequency response; material identification; reflectivity; rudimentary classification analysis; spotlight mode; synthetic aperture radar data; wide-band SAR system; Frequency response; Materials; Radar imaging; Spatial resolution; Synthetic aperture radar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radar Conference (RADAR), 2012 IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1097-5659
  • Print_ISBN
    978-1-4673-0656-0
  • Type

    conf

  • DOI
    10.1109/RADAR.2012.6212121
  • Filename
    6212121