Title :
Analysis of functional magnetic resonance images by wavelet decomposition
Author :
Ruttimann, U.E. ; Ramsey, Nick F. ; Hommer, D.W. ; Thévenaz, Philippe ; Lee, Chulhee ; Unser, Michael
Author_Institution :
Sect. on Brain Electrophysiol. & Imaging, Nat. Inst. of Health, Bethesda, MD, USA
Abstract :
The use of the wavelet transform to detect differences between sequentially acquired functional magnetic resonance images (fMRIs) is explored. A statistical data model is developed that makes use of the orthogonality and regularity conditions of the wavelets to achieve a signal decomposition into uncorrelated components, enabling application of standard parametric tests of significance on wavelet coefficients directly. This overcomes the problems associated with high intervoxel correlations in the spatial domain, and achieves economy in statistical testing by limiting the search for significant signal components to a subspace where the signal power is located. Thus, a smaller p-value adjustment for multiple testing is required, resulting in a lower detection threshold for a given overall level of statistical significance. For the fMRIs investigated, a 10:1 reduction in the number of statistical tests was achieved, and about 1% of the wavelet coefficients were significant (p<0.05 per volume), which then served to resynthesize the difference images by inverse wavelet transform
Keywords :
biomedical NMR; brain; image sequences; inverse problems; medical image processing; neurophysiology; statistical analysis; wavelet transforms; detection threshold; difference images; functional magnetic resonance images; inverse wavelet transform; multiple testing; orthogonality conditions; parametric tests; regularity conditions; signal decomposition; signal power subspace; statistical data model; statistical significance; statistical testing; uncorrelated components; wavelet coefficients; wavelet decomposition; wavelet transform; Data models; Image analysis; Magnetic analysis; Magnetic resonance; Signal resolution; Standards development; Testing; Wavelet analysis; Wavelet coefficients; Wavelet transforms;
Conference_Titel :
Image Processing, 1995. Proceedings., International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-7310-9
DOI :
10.1109/ICIP.1995.531446