• DocumentCode
    2267298
  • Title

    Concurrent Online Test Architecture for Multiple Controller Blocks with Minimum Fault Latency

  • Author

    Daniel, Philemon ; Chandel, Rajeevan

  • Author_Institution
    Electron. & Commun. Eng. Dept., Nat. Inst. of Technol. Hamirpur, Hamirpur, India
  • fYear
    2011
  • fDate
    26-28 May 2011
  • Firstpage
    45
  • Lastpage
    49
  • Abstract
    A test architecture to perform online testing for multiple blocks concurrently is presented in this paper. The test architecture is based on monitoring output vectors of the blocks and concurrently detecting faults. The scheme works well for critical VLSI controllers where shutting down or suspending the operation of a controller for testing is not possible and where the fault needs to be detected at the earliest, during the run time of the system. The applicability of the architecture for the control blocks in OC8051 has been demonstrated. To the best of our knowledge, the proposed architecture for concurrent online testing on multiple blocks with just a few cycles of fault latency is presented for the first time in open literature.
  • Keywords
    VLSI; computer architecture; computer testing; embedded systems; fault tolerant computing; OC8051; VLSI controllers; concurrent online test architecture; embedded system; fault detection; minimum fault latency; multiple controller blocks; Built-in self-test; Circuit faults; Computer architecture; Hardware; Logic gates; Monitoring; Concurrent test; built-in-self-test; multiple controllers; online test; output vector monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing with Applications Workshops (ISPAW), 2011 Ninth IEEE International Symposium on
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4577-0524-3
  • Electronic_ISBN
    978-0-7695-4429-8
  • Type

    conf

  • DOI
    10.1109/ISPAW.2011.65
  • Filename
    5951948