DocumentCode :
226743
Title :
Automatic learning of general type-2 fuzzy logic systems using simulated annealing
Author :
Almaraashi, Majid ; John, Ranjith ; Hopgood, Adrian
Author_Institution :
Univ. Coll. in Aljamoum, Umm Al-Qura Univ., Makkah, Saudi Arabia
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
2384
Lastpage :
2390
Abstract :
This paper reports on a new approach for automatic learning of general type-2 fuzzy logic systems (GT2FLSs) using simulated annealing (SA). The learning process in this work starts without an initial interval type-2 fuzzy system and has an objective to optimize all membership function parameters involved in the general type-2 fuzzy set in two stages. This is a novel methodology for learning GT2FLSs using the vertical-slices representation. The methodology used here is based on a proposed parameterization method presented in a previous work to ease the design of GT2FLSs. Two models of GT2FLSs have been applied using two different type-reduction techniques. The first technique is the sampling method, which is non-deterministic. The second technique is the vertical-slices centroid type-reduction (VSCTR), which is deterministic. Both models as well as an interval type-2 fuzzy logic system (IT2FLS) model have been applied to predict a Mackey-Glass time series. A comparison of the results of modeling these problems using the three models showed more accurate modeling for the GT2FLSs when using the VSCTR deterministic defuzzification method. It has also been shown that a GT2FLS with VSCTR defuzzification is more able to handle uncertainty than an IT2FLS, although the latter was faster.
Keywords :
fuzzy logic; fuzzy set theory; learning (artificial intelligence); sampling methods; simulated annealing; time series; GT2FLS; IT2FLS model; Mackey-Glass time series; SA; VSCTR deterministic defuzzification method; automatic learning; general type-2 fuzzy logic systems; general type-2 fuzzy set; interval type-2 fuzzy system; learning process; membership function parameters; nondeterministic sampling method; parameterization method; simulated annealing; type-reduction techniques; vertical-slices centroid type-reduction; vertical-slices representation; Fuzzy logic; Fuzzy sets; Simulated annealing; Testing; Time series analysis; Training; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fuzzy Systems (FUZZ-IEEE), 2014 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-2073-0
Type :
conf
DOI :
10.1109/FUZZ-IEEE.2014.6891694
Filename :
6891694
Link To Document :
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