DocumentCode :
2267498
Title :
Robust faces manifold modeling: Most expressive Vs. most Sparse criterion
Author :
Tan, Xiaoyang ; Qiao, Lishan ; Gao, Wenjuan ; Liu, Jun
Author_Institution :
Dept. of Comput. Sci. & Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
fYear :
2009
fDate :
Sept. 27 2009-Oct. 4 2009
Firstpage :
139
Lastpage :
146
Abstract :
Robust face image modeling under uncontrolled conditions is crucial for the current face recognition systems in practice. One approach is to seek a compact representation of the given image set which encodes the intrinsic lower dimensional manifold of them. Among others, Local Linear Embedding (LLE) is one of the most popular method for that purpose. However, it suffers from the following problems when used for face modeling: 1) it is not robust under uncontrolled conditions (e.g., the underlying images may contain large appearance distortions such as partial occlusion or extreme illumination variations); 2) a fixed neighborhood size is used for all the local patches without considering the actual distribution of samples in the input space; 3) the modeled local structures may not contain enough discriminative information which is essential to the later recognition stage. In this paper, we introduce the Sparse Locally Linear Embedding (SLLE) to address these issues. By replacing the most-expressive type criterion in modeling local patches in LLE with a most-sparse one, SLLE essentially finds and models more discriminative patches. This gives higher model flexibility in the sense of less sensitiveness to incorrect model and higher robustness to outliers. The feasibility and effectiveness of the proposed method is verified with encouraging results on a publicly available face database.
Keywords :
face recognition; image representation; face database; face recognition system; fixed neighborhood size; image representation; local linear embedding; most expressive criterion; most sparse criterion; robust face image modeling; robust face manifold modeling; sparse locally linear embedding; Computer vision; Conferences; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-4442-7
Electronic_ISBN :
978-1-4244-4441-0
Type :
conf
DOI :
10.1109/ICCVW.2009.5457706
Filename :
5457706
Link To Document :
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