DocumentCode
2267553
Title
Picosecond X-ray diffraction studies of shocked crystals
Author
Wark ; Allen, Alicia ; Loveridge-Smith ; Belak ; Kalantar, D. ; Lee ; Pollaine ; Remington ; Weber, Simon ; Boehly ; Hauer ; Holian ; Kyrala ; Lomdahl, P. ; Paisley ; Swift, D.C. ; Meyers
Author_Institution
Dept. of Phys., Oxford Univ., UK
fYear
2002
fDate
24-24 May 2002
Firstpage
299
Abstract
Summary from only given. We present experimental time-resolved X-ray diffraction data that provide firm evidence that the response of single crystal silicon to nanosecond timescale uniaxial shock compression along the (400) axis is anomalous in that it is purely elastic.
Keywords
X-ray diffraction; elasticity; high-speed techniques; shock wave effects; silicon; Si; nanosecond timescale uniaxial shock compression; picosecond X-ray diffraction studies; purely elastic; shocked crystals; single crystal silicon; time-resolved X-ray diffraction data; Crystals; Electric shock; Laboratories; Laser theory; Lattices; Optical propagation; Pulse measurements; Shock waves; X-ray diffraction; X-ray lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location
Long Beach, CA, USA
Print_ISBN
1-55752-706-7
Type
conf
DOI
10.1109/CLEO.2002.1034000
Filename
1034000
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