Title :
Picosecond X-ray diffraction studies of shocked crystals
Author :
Wark ; Allen, Alicia ; Loveridge-Smith ; Belak ; Kalantar, D. ; Lee ; Pollaine ; Remington ; Weber, Simon ; Boehly ; Hauer ; Holian ; Kyrala ; Lomdahl, P. ; Paisley ; Swift, D.C. ; Meyers
Author_Institution :
Dept. of Phys., Oxford Univ., UK
Abstract :
Summary from only given. We present experimental time-resolved X-ray diffraction data that provide firm evidence that the response of single crystal silicon to nanosecond timescale uniaxial shock compression along the (400) axis is anomalous in that it is purely elastic.
Keywords :
X-ray diffraction; elasticity; high-speed techniques; shock wave effects; silicon; Si; nanosecond timescale uniaxial shock compression; picosecond X-ray diffraction studies; purely elastic; shocked crystals; single crystal silicon; time-resolved X-ray diffraction data; Crystals; Electric shock; Laboratories; Laser theory; Lattices; Optical propagation; Pulse measurements; Shock waves; X-ray diffraction; X-ray lasers;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034000
