Title :
Structural dynamics in laser-excited solids investigated with femtosecond X-ray diffraction
Author :
Sokolowski-Tinten, K. ; Blome ; Dietrich, Christian ; Blums ; Horn-Von-Hoegen ; von der Linde, D. ; Cavalleri, A. ; Squier, Jeff ; Kammler, M.
Author_Institution :
Inst. for Laser-& Plasmaphys., Essen Univ., Germany
Abstract :
Summary form only given. Ultrashort x-ray pulses offer a unique combination of atomic-scale spatial and temporal resolution, which permits direct measurements of structural transients on an ultrafast time scale. Using time-resolved X-ray diffraction with femtosecond, multi-keV X-ray pulses we have studied transient lattice dynamics in optically excited semiconductors and metals. In an optical pump/X-ray probe configuration transient changes in X-ray diffraction from [111]-oriented, single-crystalline thin films of Ge and Bi have been measured.
Keywords :
X-ray diffraction; bismuth; germanium; high-speed optical techniques; laser beam effects; transients; Bi; Ge; X-ray diffraction; [111]-oriented; atomic-scale spatial resolution; femtosecond X-ray diffraction; laser-excited solids; metals; optical pump/X-ray probe configuration; semiconductors; single-crystalline thin films; structural dynamics; structural transients; transient lattice dynamics; ultrashort x-ray pulses; Atom optics; Atomic measurements; Optical diffraction; Optical films; Optical pulses; Pulse measurements; Solid lasers; Ultrafast optics; X-ray diffraction; X-ray lasers;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034001
