• DocumentCode
    2267621
  • Title

    Large margin classifiers based on convex class models

  • Author

    Cevikalp, Hakan ; Triggs, Bill

  • Author_Institution
    Eskisehir Osmangazi Univ., Eskisehir, Turkey
  • fYear
    2009
  • fDate
    Sept. 27 2009-Oct. 4 2009
  • Firstpage
    101
  • Lastpage
    108
  • Abstract
    We propose large margin classifiers that are sometimes better than Support Vector Machines (SVMs) for high-dimensional classification problems with limited numbers of training samples. The basic idea is to approximate each class with a convex model of some form based on its training samples. For any pair of models of this form, there is a corresponding linear classifier that maximizes the margin between the models, and this can be found efficiently by solving a convex program that finds the closest pair of points in the two sets. If the classes are modeled with the convex hulls of their samples the result is the standard SVM, but many other convex models are possible. As examples we investigate maximum margin classifiers based on affine hull and bounding hyperdisk models. These methods can also be kernelized by working in orthonormal coordinates on the subspace of feature space spanned by the training samples. We compare the resulting margin-between-convex-model methods to SVM and to the corresponding nearest-convex-model classifiers on several data sets, showing that they are often competitive with these well-established approaches.
  • Keywords
    pattern classification; support vector machines; afftne hull; bounding hyperdisk models; convex class models; convex program; large margin classifiers; margin between convex model methods; support vector machines; Computer vision; Genetics; Nearest neighbor searches; Neural networks; Particle separators; Prototypes; Solid modeling; Support vector machine classification; Support vector machines; Text categorization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision Workshops (ICCV Workshops), 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-4442-7
  • Electronic_ISBN
    978-1-4244-4441-0
  • Type

    conf

  • DOI
    10.1109/ICCVW.2009.5457713
  • Filename
    5457713