DocumentCode
2267668
Title
A study of chip thermal crosstalk in plastic VLSI packages
Author
Chien, David H. ; Lee, Chin C.
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
fYear
1995
fDate
7-9 Feb 1995
Firstpage
37
Lastpage
38
Abstract
Plastic VLSI packages are modeled as five-layer structure. Lateral boundaries are assumed to extend to infinity for a planar reference structure. With a small heat source on the silicon chip, calculation results show that the temperature profile on the chip decreases exponentially for distance greater than a specific value. An empirical temperature expression is thus established. The expression enables efficient calculation of temperatures at remote locations. These temperatures are important for large chip devices having large number of small heat sources
Keywords
VLSI; crosstalk; integrated circuit modelling; integrated circuit packaging; plastic packaging; chip thermal crosstalk; empirical temperature expression; five-layer structure; heat source; large chip devices; lateral boundaries; planar reference structure; plastic VLSI packages; remote locations; temperature profile; Analytical models; Crosstalk; H infinity control; Isothermal processes; Manufacturing; Microelectronics; Plastic packaging; Silicon; Temperature; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1995. SEMI-THERM XI., Eleventh Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
0-7803-2434-X
Type
conf
DOI
10.1109/STHERM.1995.512049
Filename
512049
Link To Document