Title :
A study of chip thermal crosstalk in plastic VLSI packages
Author :
Chien, David H. ; Lee, Chin C.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
Abstract :
Plastic VLSI packages are modeled as five-layer structure. Lateral boundaries are assumed to extend to infinity for a planar reference structure. With a small heat source on the silicon chip, calculation results show that the temperature profile on the chip decreases exponentially for distance greater than a specific value. An empirical temperature expression is thus established. The expression enables efficient calculation of temperatures at remote locations. These temperatures are important for large chip devices having large number of small heat sources
Keywords :
VLSI; crosstalk; integrated circuit modelling; integrated circuit packaging; plastic packaging; chip thermal crosstalk; empirical temperature expression; five-layer structure; heat source; large chip devices; lateral boundaries; planar reference structure; plastic VLSI packages; remote locations; temperature profile; Analytical models; Crosstalk; H infinity control; Isothermal processes; Manufacturing; Microelectronics; Plastic packaging; Silicon; Temperature; Very large scale integration;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1995. SEMI-THERM XI., Eleventh Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-2434-X
DOI :
10.1109/STHERM.1995.512049