DocumentCode
2267807
Title
Application of method to look for basis functions of C2v for solving 2D scattering problems
Author
Liu, Lina ; Zhu, Feng ; Niu, Dapeng ; Xu, Changwei
Author_Institution
Sch. of Electr. Eng., Southwest Jiaotong Univ., Chengdu, China
fYear
2010
fDate
28-30 July 2010
Firstpage
735
Lastpage
737
Abstract
A regular representation can be determined for a prism with cross section of biaxial symmetry. Then reduce the regular representation and determine the complete basis.The calculation results show that to describe scattering object surface current with this basis function expansion is of fast convergence speed and high accuracy.
Keywords
computational electromagnetics; electromagnetic wave scattering; method of moments; 2D scattering problems; basis function expansion; basis functions; biaxial symmetry; cross section; fast convergence speed; prism; regular representation; scattering object surface current; Accuracy; Convergence; Equations; Finite element methods; Mathematical model; Scattering; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, Circuits and Systems (ICCCAS), 2010 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-8224-5
Type
conf
DOI
10.1109/ICCCAS.2010.5581898
Filename
5581898
Link To Document