DocumentCode :
2267807
Title :
Application of method to look for basis functions of C2v for solving 2D scattering problems
Author :
Liu, Lina ; Zhu, Feng ; Niu, Dapeng ; Xu, Changwei
Author_Institution :
Sch. of Electr. Eng., Southwest Jiaotong Univ., Chengdu, China
fYear :
2010
fDate :
28-30 July 2010
Firstpage :
735
Lastpage :
737
Abstract :
A regular representation can be determined for a prism with cross section of biaxial symmetry. Then reduce the regular representation and determine the complete basis.The calculation results show that to describe scattering object surface current with this basis function expansion is of fast convergence speed and high accuracy.
Keywords :
computational electromagnetics; electromagnetic wave scattering; method of moments; 2D scattering problems; basis function expansion; basis functions; biaxial symmetry; cross section; fast convergence speed; prism; regular representation; scattering object surface current; Accuracy; Convergence; Equations; Finite element methods; Mathematical model; Scattering; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications, Circuits and Systems (ICCCAS), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8224-5
Type :
conf
DOI :
10.1109/ICCCAS.2010.5581898
Filename :
5581898
Link To Document :
بازگشت