Title :
1995 cumulative bibliography of articles on semiconductor thermal and temperature testing
Author_Institution :
OAI/SAG, Milpitas, CA, USA
Abstract :
The bibliography given consists of 629 articles covering semiconductor thermal and/or temperature characteristics, measurement techniques and results, hardware applications, and other pertinent information
Keywords :
bibliographies; cooling; infrared imaging; integrated circuit packaging; integrated circuit testing; semiconductor device packaging; semiconductor device testing; temperature measurement; thermal analysis; thermal resistance; thermal variables measurement; IC; bibliography; measurement techniques; packaging; semiconductor devices; temperature characteristics; temperature testing; thermal testing; Bibliographies; Circuit testing; Electrical resistance measurement; Electromagnetic heating; Electronic packaging thermal management; Semiconductor device testing; Semiconductor diodes; Solid state circuits; Temperature measurement; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1995. SEMI-THERM XI., Eleventh Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-2434-X
DOI :
10.1109/STHERM.1995.512065
