DocumentCode
2268004
Title
1995 cumulative bibliography of articles on semiconductor thermal and temperature testing
Author
Siegal, Bernard
Author_Institution
OAI/SAG, Milpitas, CA, USA
fYear
1995
fDate
7-9 Feb 1995
Firstpage
156
Lastpage
183
Abstract
The bibliography given consists of 629 articles covering semiconductor thermal and/or temperature characteristics, measurement techniques and results, hardware applications, and other pertinent information
Keywords
bibliographies; cooling; infrared imaging; integrated circuit packaging; integrated circuit testing; semiconductor device packaging; semiconductor device testing; temperature measurement; thermal analysis; thermal resistance; thermal variables measurement; IC; bibliography; measurement techniques; packaging; semiconductor devices; temperature characteristics; temperature testing; thermal testing; Bibliographies; Circuit testing; Electrical resistance measurement; Electromagnetic heating; Electronic packaging thermal management; Semiconductor device testing; Semiconductor diodes; Solid state circuits; Temperature measurement; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1995. SEMI-THERM XI., Eleventh Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
0-7803-2434-X
Type
conf
DOI
10.1109/STHERM.1995.512065
Filename
512065
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