A coherent spectrophotometer for optical characterization

Author

Balachninaite, O. ; Bingelyte, V. ; Grigonis, R. ; Sirutkaitis, Valdas

Author_Institution

Laser Res. Center, Vilnius Univ., Lithuania

fYear

2002

fDate

24-24 May 2002

Firstpage

313

Abstract

Summary from only given. We describe a coherent spectrophotometer based on optical parametric oscillators (OPO´s) for optical-coating and optical component characterization in the spectral range 420-4500 nm. The characterization includes measurements of reflectance and transmittance, absorption losses, and laser-induced damage thresholds. Our spectrophotometer laser/OPO radiation source configuration is illustrated.

Keywords

measurement by laser beam; optical elements; optical films; optical parametric oscillators; optical testing; spectrophotometers; spectroscopic light sources; 420 to 4500 nm; absorption losses; coherent spectrophotometer; laser-induced damage; optical component characterization; optical parametric oscillators; optical testing; optical-coating; reflectance; spectral range; spectrophotometer laser/OPO radiation source configuration; transmittance; Absorption; Laser excitation; Laser modes; Nonlinear optics; Optical devices; Optical harmonic generation; Optical pulses; Optical pumping; Pulse amplifiers; Pump lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the

Conference_Location

Long Beach, CA, USA

Print_ISBN

1-55752-706-7

Type

conf

DOI

10.1109/CLEO.2002.1034023

Filename

1034023