DocumentCode
2268111
Title
A Configurable Approach to Tolerate Soft Errors via Partial Software Protection
Author
Xiong, Lei ; Tan, Qingping
Author_Institution
Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China
fYear
2011
fDate
26-28 May 2011
Firstpage
260
Lastpage
265
Abstract
Compared with hardware-based methods, software-based methods which need not additional hardware costs are regarded as efficient methods to tolerate soft errors. Software-based methods which are implemented by software protection have performance sacrifice. This paper proposes a new configurable approach whose purpose is to balance system reliability and performance, to tolerate soft errors via partial software protection. Those unprotected software regions which are motivated by soft error mask on software level are related to statically dead codes, those codes whose probabilities to be executed are low and some partially dead codes. For those protected codes, we copy every data and operate every operation twice to ensure those data stored into memory are right. Additionally, we ensure every branch instruction can jump to the right address by checking condition and destination address. Finally, our approach is implemented by modification of compiler. System reliability and performance are evaluated with different configurations. Experimental results demonstrate our purpose to balance system reliability and performance.
Keywords
safety-critical software; software fault tolerance; software performance evaluation; compiler modification; configurable approach; dead codes; destination address; fault tolerance; partial software protection; soft error mask; system performance evaluation; system reliability; Fault tolerance; Fault tolerant systems; Hardware; Software; Software protection; Software reliability; control flow; fault tolerance; partially dead codes; performance; reliability; soft errors;
fLanguage
English
Publisher
ieee
Conference_Titel
Parallel and Distributed Processing with Applications Workshops (ISPAW), 2011 Ninth IEEE International Symposium on
Conference_Location
Busan
Print_ISBN
978-1-4577-0524-3
Electronic_ISBN
978-0-7695-4429-8
Type
conf
DOI
10.1109/ISPAW.2011.45
Filename
5951985
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