Title :
Measurements of optical loss in GaAs/Al/sub 2/O/sub 3/ nonlinear waveguides in the infrared using femtosecond scattering technique
Author :
Moutzouris, K. ; Venugopal Rao, S. ; Ebrahimzadeh, M. ; De Rossi, A. ; Calligaro, M. ; Ortiz, Victor ; Ginitz, G. ; Berger, V.
Author_Institution :
Sch. of Phys. & Astron., Univ. of St. Andrews, UK
Abstract :
Summary from only given. We measured the loss coefficient for GaAs/Al/sub 2/O/sub 3/ waveguides in the telecommunication window (near 1.5 /spl mu/m) and near 2.0 /spl mu/m, where these waveguides are proven to be strong candidates for nonlinear frequency conversion. Using the scattering technique and femtosecond pulses for the first time the losses were evaluated for semiconductor waveguides over an extended wavelength range from 1.3 to 2.1 /spl mu/m.
Keywords :
alumina; gallium arsenide; high-speed optical techniques; light scattering; optical frequency conversion; optical loss measurement; optical waveguides; 1.3 to 2.1 micron; 1.5 micron; 2.0 micron; GaAs-Al/sub 2/O/sub 3/; GaAs/Al/sub 2/O/sub 3/ waveguide; IR optical loss measurement; extended wavelength range; femtosecond pulses; femtosecond scattering technique; loss coefficient measurement; nonlinear frequency conversion; scattering technique; semiconductor waveguides; telecommunication window; Frequency conversion; Frequency measurement; Gallium arsenide; Loss measurement; Nonlinear optics; Optical losses; Optical scattering; Optical waveguides; Semiconductor waveguides; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034029
