Title :
Generalization of search state equivalence for automatic test pattern generation
Author :
Chen, Xinghao ; Bushnell, Michael L.
Author_Institution :
CAIP Center, Rutgers Univ., Piscataway, NJ, USA
Abstract :
We present a generalization of the equivalent search state (EST) approach for test generation. A search state represents the current search status based on prior search decisions. The generalized EST identifies 56% more previously-searched decision spaces than its predecessor on the 1985 ISCAS benchmarks. We present the enabling theorem with a proof, results and an example for sequential circuit test generation
Keywords :
automatic testing; integrated circuit testing; logic testing; search problems; sequential circuits; automatic test pattern generation; current search status; enabling theorem; previously-searched decision spaces; prior search decisions; search state equivalence; sequential circuit test generation; Acceleration; Automatic test pattern generation; Automatic testing; Benchmark testing; Built-in self-test; Circuit testing; Redundancy; Sequential analysis; Sequential circuits; Test pattern generators;
Conference_Titel :
VLSI Design, 1995., Proceedings of the 8th International Conference on
Conference_Location :
New Delhi
Print_ISBN :
0-8186-6905-5
DOI :
10.1109/ICVD.1995.512085
