• DocumentCode
    2268728
  • Title

    Effective protection circuits used in high power step-down converter

  • Author

    Zekun, Zhou ; Xuan, Lu ; Xin, Ming ; Bo, Zhang

  • Author_Institution
    State key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2010
  • fDate
    28-30 July 2010
  • Firstpage
    522
  • Lastpage
    526
  • Abstract
    Effective protection circuits for high power step-down converter are presented in this paper to protect the converter from damage under any fault condition. A novel built-in soft-start circuit with simple topology is implemented by controlling the input reference voltage of error amplifier to eliminate the inrush current and avoid the overshoot of the output voltage without using external capacitor, which reduces the component cost, saves board space and benefits for portable applications. Besides, an enhanced current limit strategy is proposed to guarantee the proper work of the converter in normal load, and avoid “current tail” in major overload or short circuit. The proposed circuits have been validated with 18V high-voltage CMOS process based on a monolithic voltage-mode step-down converter capable of driving up to 1A loads with supply voltage from 5 to 18V. Simulation results demonstrate that the proposed protection circuits can guarantee the step-down converter operating properly under any condition without damage.
  • Keywords
    power amplifiers; power capacitors; power convertors; voltage control; built-in soft-start circuit; current 1 A; error amplifier; external capacitor; high power step-down converter; high-voltage CMOS process; input reference voltage control; inrush current; monolithic voltage-mode step-down converter; portable applications; protection circuits; short circuit; voltage 18 V; voltage 5 V to 18 V; Converters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems (ICCCAS), 2010 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8224-5
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2010.5581941
  • Filename
    5581941