Title :
A highly testable ASIC for telephone signaling
Author :
Jayalakshmi, P. ; Vidya, S. ; Krishnakumar, S. ; Ravisankar, K. ; Kumar, Pamela
Author_Institution :
Semicond. Complex Ltd., Bangalore, India
Abstract :
A highly testable ASIC for telephone signaling was developed by converting an existing card design into an ASIC. This paper details how the conversion of the design helped in introducing on-line system diagnostic functions. Also during this process various strategies had to be adopted to make the functional and fault simulation time efficient
Keywords :
application specific integrated circuits; design for testability; digital integrated circuits; integrated circuit design; integrated circuit testing; telecommunication signalling; telephone equipment; telephony; fault simulation; functional simulation; highly testable ASIC; online system diagnostic functions; telephone signaling; Application specific integrated circuits; CMOS process; Discrete event simulation; Hardware; Observability; Random access memory; Signal design; Signal processing; System testing; Telephony;
Conference_Titel :
VLSI Design, 1995., Proceedings of the 8th International Conference on
Conference_Location :
New Delhi
Print_ISBN :
0-8186-6905-5
DOI :
10.1109/ICVD.1995.512101
