Title :
Sensitivity of the random demodulation framework to filter tolerances
Author :
Pankiewicz, Pawel J. ; Arildsen, Thomas ; Larsen, Torben
Author_Institution :
Dept. of Electron. Syst., Aalborg Univ., Aalborg, Denmark
fDate :
Aug. 29 2011-Sept. 2 2011
Abstract :
The aim of the present paper is to demonstrate the impact of low-pass filter non-idealities on compressed sensing signal reconstruction in the random demodulator (RD) architecture. The random demodulator is a compressed sensing (CS) acquisition scheme capable of acquiring signals in continuous time. One of the main advantages of the system is the possibility to use off-the-shelf components to implement this sub-Nyquist framework. Low-pass filtering plays an important role in the RD analog acquisition process, which needs to be modeled carefully in the digital part of the compressive sensing reconstruction. Having a complete model of the analog front-end, CS algorithms conduct almost perfect reconstruction taking far less samples than for traditional Nyquist-rate sampling. This paper investigates reconstruction sensitivity to distortion in the impulse response of the low-pass filter caused by passive component value fluctuations. The authors simulate common CS recovery algorithms and show that the worst-case performance degradation due to filter component tolerances can be substantial, which requires special attention when designing reconstruction algorithms for RD.
Keywords :
demodulation; low-pass filters; sensitivity analysis; CS recovery algorithms; Nyquist-rate sampling; RD analog acquisition process; compressed sensing signal reconstruction; filter tolerances; low-pass filter nonidealities; passive component value fluctuations; random demodulation framework; sensitivity; sub-Nyquist framework; Compressed sensing; Demodulation; Matching pursuit algorithms; Mathematical model; Semiconductor device measurement; Signal to noise ratio; Vectors;
Conference_Titel :
Signal Processing Conference, 2011 19th European
Conference_Location :
Barcelona