• DocumentCode
    2268960
  • Title

    Continuous Verification of Large Embedded Software Using SMT-Based Bounded Model Checking

  • Author

    Cordeiro, Lucas ; Fischer, Bernd ; Marques-Silva, Joao

  • Author_Institution
    Univ. of Southampton, Southampton, UK
  • fYear
    2010
  • fDate
    22-26 March 2010
  • Firstpage
    160
  • Lastpage
    169
  • Abstract
    The complexity of software in embedded systems has increased significantly over the last years so that software verification now plays an important role in ensuring the overall product quality. In this context, bounded model checking has been successfully applied to discover subtle errors, but for larger applications, it often suffers from the state space explosion problem. This paper describes a new approach called continuous verification to detect design errors as quickly as possible by exploiting information from the software configuration management system and by combining dynamic and static verification to reduce the state space to be explored. We also give a set of encodings that provide accurate support for program verification and use different background theories in order to improve scalability and precision in a completely automatic way. A case study from the telecommunications domain shows that the proposed approach improves the error-detection capability and reduces the overall verification time by up to 50%.
  • Keywords
    embedded systems; program verification; software management; SMT based bounded model checking; large embedded software; product quality; software complexity; software configuration management system; software verification; Application software; Computer errors; Context modeling; Embedded software; Embedded system; Explosions; Software quality; Software systems; Space exploration; State-space methods; Bounded Model Checking; Embedded Software Verification; Satisfiability Modulo Theories;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering of Computer Based Systems (ECBS), 2010 17th IEEE International Conference and Workshops on
  • Conference_Location
    Oxford
  • Print_ISBN
    978-1-4244-6537-8
  • Electronic_ISBN
    978-1-4244-6538-5
  • Type

    conf

  • DOI
    10.1109/ECBS.2010.24
  • Filename
    5457776