• DocumentCode
    2269604
  • Title

    High accuracy numerical method for index of refraction estimation with surface plasmon bandgap structures

  • Author

    Alleyne, Colin J. ; Kirk, Andrew G. ; Charette, Paul G.

  • Author_Institution
    Photonics Syst. Group, McGill Univ., Montreal, QC
  • fYear
    2008
  • fDate
    4-9 May 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Eigenvector analysis on 2D surface plasmon photonic bandgap images is used for refractive index estimation. High precision (rms error of 3.8 times 10-8RIU) and large dynamic range (n = 1.305 to 1.375) are achieved with noisy data.
  • Keywords
    eigenvalues and eigenfunctions; energy gap; optical materials; photonic band gap; refractive index; surface plasmon resonance; 2D surface plasmon photonic bandgap images; eigenvector analysis; refractive index estimation; surface plasmon bandgap structure; Dynamic range; Focusing; Lenses; Optical refraction; Optical surface waves; Photonic band gap; Plasmons; Reflectivity; Refractive index; Resonance; 050.1950; 130.6010; 240.6680; 260.3910;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-55752-859-9
  • Type

    conf

  • Filename
    4572965
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2269604