Title :
Experiment design for determination of transverse energy profile field emitted electron beam
Author :
Phillips, P.M. ; Zaidman, E.G. ; Hor, C. ; Malsawma, L.
Author_Institution :
Sci. Applications Int. Corp., McLean, VA, USA
Abstract :
Summary form only given, as follows. An experiment is being designed to determine the energy profile of an electron beam produced by field emitter arrays and to provide correlation with simulation. The energy distribution is measured by means of a microfabricated detector which is manipulated within an UHV environment. The quality of performance of an electron gun depends on two major factors: energy distribution, and the intensity of the electron beam. Microwave tubes as well as display devices require the capability of focussing the beam without excessive angular spread and of transporting the beam without losses. Beam brightness and emittance are a measure of the applicability of the emitted beam toward the required performance. The detector is in the form of a Faraday cup with multiple apertures. In order to measure the emittance, the location of the detector is determined via laser interferometry. The details of the instrumentation and experiment automation will be shown. By analysis of single tip emitters, the simulation of the emitted current, field distribution and beam trajectory is compared with experiment.
Keywords :
electron beam focusing; electron beams; electron field emission; electron guns; light interferometry; microwave tubes; particle beam diagnostics; simulation; vacuum microelectronics; Faraday cup; UHV environment; beam brightness; beam emittance; beam focussing; beam trajectory; display devices; electron beam intensity; electron gun; emitted current; energy distribution; experiment design; field distribution; field emitter arrays; laser interferometry; microfabricated detector; microwave tubes; simulation; single tip emitters; transverse energy profile field emitted electron beam; Apertures; Brightness; Detectors; Displays; Electron beams; Energy measurement; Field emitter arrays; Interferometry; Laser beams; Microwave devices;
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
Print_ISBN :
0-7803-2669-5
DOI :
10.1109/PLASMA.1995.531560