• DocumentCode
    2269838
  • Title

    X/Ku-Band SiGe BiCMOS Phased Array Chips with Simultaneous 2- and 4-Beam Capabilities

  • Author

    Kang, Dong-Woo ; Rebeiz, Gabriel M. ; Koh, Kwang-Jin

  • Author_Institution
    Electr. & Comput. Eng., UCSD, San Diego, CA, USA
  • fYear
    2009
  • fDate
    11-14 Oct. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents RFIC phased array receive chips capable of formation 2- and 4- simultaneous beams from the same antenna input with 4-bit amplitude and phase control. The design is based on a SiGe BiCMOS process (Jazz SiGe18Hx) and results in excellent isolation between the different beams. The 2-beam chip results in a gain of 5-6 dB per channel at 14-15 GHz, a noise figure of 10.0 dB, a P1dB of -13 dBm per channel (IIP3 of-6 dBm), and an RMS phase and gain error of < 12deg and 1.5 dB, respectively. A gain control of 17 dB is available at each channel. Most important, the on-chip isolation between the channels has been fully characterized and is > 30 dB at 11-15 GHz. The beams can operate over an instantaneous bandwidth of > 1 GHz at any frequency between 11 and 15 GHz, and both beams can be at the same frequency if required. The 4-beam chip is currently being tested and the results will be reported at the conference.
  • Keywords
    BiCMOS integrated circuits; Ge-Si alloys; field effect MMIC; isolation technology; Ku-band BiCMOS phased array chips; RFIC phased array receive chips; SiGe; X-band BiCMOS phased array chips; antenna input; four-beam chip; frequency 11 GHz to 15 GHz; noise figure 10.0 dB; on-chip isolation; phase control; two-beam chip; Antenna arrays; BiCMOS integrated circuits; Frequency; Gain; Germanium silicon alloys; Phase control; Phased arrays; Radiofrequency integrated circuits; Receiving antennas; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium, 2009. CISC 2009. Annual IEEE
  • Conference_Location
    Greensboro, NC
  • ISSN
    1550-8781
  • Print_ISBN
    978-1-4244-5191-3
  • Electronic_ISBN
    1550-8781
  • Type

    conf

  • DOI
    10.1109/csics.2009.5315635
  • Filename
    5315635