• DocumentCode
    2270032
  • Title

    Combined optimization of area and testability during state assignment of PLA-based FSM´s

  • Author

    Mohan, C. Rama ; Chakrabarti, P.P.

  • Author_Institution
    Cadence Design Syst. (India) Pvt Ltd., Noida, India
  • fYear
    1995
  • fDate
    4-7 Jan 1995
  • Firstpage
    408
  • Lastpage
    413
  • Abstract
    Stuck-at and crosspoint faults in PLA´s, introduce combinational and sequential redundancies into PLA-based FSM´s, this affecting the testability of these FSM´s. In this paper, we propose a new state assignment algorithm for PLA-based FSM´s called EARTH, which considers both aspects of area minimization and testability of the resultant PLA´s with the fault model containing single stuck-at and/or single cross-point faults. We have also developed an algorithm that checks for redundancies in a PLA-based FSM. We have found the redundancies in FSM´s that have been state encoded using EARTH with our redundancy detector and areas of these MCNC Benchmark FSM´s. EARTH has yielded 5 times less undetectable faults on these FSMs than NOVA (approx) with areas 2% more than NOVA (approx), on an average
  • Keywords
    circuit layout CAD; circuit optimisation; design for testability; fault diagnosis; finite state machines; integrated circuit layout; integrated circuit testing; logic CAD; logic testing; minimisation of switching nets; programmable logic arrays; redundancy; state assignment; EARTH algorithm; PLA-based FSM; area minimization; combined optimization; fault model; redundancy checker; single cross-point faults; single stuck-at faults; state assignment; testability optimisation; Circuit faults; Circuit testing; Computer science; Earth; Logic testing; Programmable logic arrays; Redundancy; Sequential analysis; Sequential circuits; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1995., Proceedings of the 8th International Conference on
  • Conference_Location
    New Delhi
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-6905-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1995.512148
  • Filename
    512148