DocumentCode
2270191
Title
A novel monolithic linearized HEMT LNA using HBT tuneable active feedback
Author
Kobayashi, K.W. ; Streit, D.C. ; Oki, A.K. ; Umemoto, D.K. ; Block, T.R.
Author_Institution
Electron. & Technol. Div., TRW Inc., Redondo Beach, CA, USA
Volume
3
fYear
1996
fDate
17-21 June 1996
Firstpage
1217
Abstract
For the first time, a novel HBT active feedback circuit is employed with a HEMT LNA which improves linearity (IP3) and gain-bandwidth performance without significantly impacting noise figure. The HEMT and HBT circuits are monolithically integrated using selective molecular beam epitaxy (MBE). The HEMT LNA achieves a nominal gain of 9 dB and noise figure of 2.5-3 dB from 1-11 GHz. By adjusting the bias of the HBT active feedback circuit, positive feedback can be induced which can increase the gain bandwidth from 11 to 16 GHz. In addition, the IP3 can be tuned from less than 20 dBm to >24 dBm across a 1-11 GHz band with a peak improvement of 10 dB. At S-band, as much as 20 dB reduction in IM3 products has been demonstrated using the HBT active feedback. Compared to an equivalent design which employs resistive feedback only, the active feedback design achieves a 50% improvement in gain-bandwidth and a 4-10 dB improvement in IP3 while maintaining comparable noise figure performance and consuming only 15% additional dc power. This HBT active feedback linearization technique is a cost effective means of improving the linearity of HEMT-based LNA/receiver MMICs for use in multi-carrier wireless communications.
Keywords
HEMT integrated circuits; MMIC amplifiers; bipolar analogue integrated circuits; feedback amplifiers; heterojunction bipolar transistors; 1 to 11 GHz; 11 to 16 GHz; 2.5 to 3 dB; 9 dB; HBT tuneable active feedback circuit; HEMT LNA; IM3 product; IP3; MMIC receiver; S-band; gain bandwidth; linearity; linearization; monolithic integration; multi-carrier wireless communications; noise figure; selective molecular beam epitaxy; Bandwidth; Feedback circuits; Gain; HEMTs; Heterojunction bipolar transistors; Linearity; Linearization techniques; Molecular beam epitaxial growth; Noise figure; Tunable circuits and devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-3246-6
Type
conf
DOI
10.1109/MWSYM.1996.512155
Filename
512155
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