DocumentCode :
2270201
Title :
Fault Diagnosis Model of WSN Based on Rough Set and Neural Network Ensemble
Author :
Ren, Weizheng ; Xu, Lianming ; Deng, Zhongliang
Author_Institution :
Sch. of Electron. Eng., Beijing Univ. of Posts & Telecommun., Beijing
Volume :
3
fYear :
2008
fDate :
20-22 Dec. 2008
Firstpage :
540
Lastpage :
543
Abstract :
An intelligent fault diagnosis model of wireless sensor networks (WSN) using rough set and artificial neural network ensemble (RS-ANNE) is developed to solve the fault diagnosis problems of WSN such as limited energy and substantive information redundancyiquestthus prolonging service life of the whole WSN effectively. The attribute reduction for decision of fault diagnosis is utilized based on the discriminate matrix in rough set theory. The minimum fault diagnostic characteristics subset with the greatest contributions is selected so that preliminary topological structure of the neural network is determined. The network is trained to reflect mapping relationship between inputs and outputs, and network ensemble is used to realize the fault diagnosis. Simulation results show that diagnostic accuracy of the proposed method is 95.67%. Computation amount of RS-ANNE is decreased by 13.88% and diagnosis accuracy is increased by 22.98%, compared with those of ANNE.
Keywords :
fault diagnosis; matrix algebra; neural nets; rough set theory; telecommunication computing; telecommunication network reliability; wireless sensor networks; RS-ANNE; WSN; discriminate matrix; intelligent fault diagnosis model; rough set and artificial neural network ensemble; service life; wireless sensor networks; Artificial intelligence; Artificial neural networks; Fault diagnosis; Information technology; Intelligent networks; Intelligent sensors; Neural networks; Power engineering and energy; Set theory; Wireless sensor networks; Fault Diagnosis; Neural; Rough Set; WSN;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3497-8
Type :
conf
DOI :
10.1109/IITA.2008.459
Filename :
4740056
Link To Document :
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