Title :
Development and validation of high precision models for SIM Planetquest
Author :
Lindensmith, Chris A. ; Briggs, H. Clark ; Beregovski, Yuri ; Feria, V. Alfonso ; Goullioud, Renaud ; Gursel, Yekta ; Harm, I. ; Kinsella, Gary ; Orzewalla, Matthew ; Phillips, Charles
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
SIM Planetquest (SIM) is a large optical interferometer for making microarcsecond measurements of the positions of stars, and to detect Earth-sized planets around nearby stars. To achieve this precision, SIM requires stability of optical components to tens of picometers per hour. The combination of SIM´s large size (9 meter baseline) and the high stability requirement makes it difficult and costly to measure all aspects of system performance on the ground. To reduce risks, costs and to allow for a design with fewer intermediate testing stages, the SIM project is developing an integrated thermal, mechanical and optical modeling process that will allow predictions of the system performance to be made at the required high precision. This modeling process uses commercial, off-the-shelf tools and has been validated against experimental results at the precision of the SIM performance requirements. This paper´ presents the description of the model development, some of the models, and their validation in the thermo-opto-mechanical (TOM3) testbed which includes full scale brassboard optical components and the metrology to test them at the SIM performance requirement levels
Keywords :
aerospace instrumentation; light interferometers; planets; stars; 9 m; Earth-sized planets; SIM Planetquest; brassboard optical components; intermediate testing; microarcsecond measurements; optical interferometers; system performance; thermo-opto-mechanical testbed; Costs; Extraterrestrial measurements; Optical devices; Optical interferometry; Planets; Position measurement; Size measurement; Stability; System performance; Testing;
Conference_Titel :
Aerospace Conference, 2006 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
0-7803-9545-X
DOI :
10.1109/AERO.2006.1655939