High performance missile testing (next generation test systems)

Complex missile technology and capability can require time consuming testing. Extensive cool down time is required between tests when the missile\´s maximum power-on time is exceeded. Throughput can become unacceptable when long periods of cool down are required. There are various techniques to speed up the testing process to achieve acceptable throughput levels. With lean budgets for developing new test systems, the Navy needs to find better ways to get the most "bang-for-the-buck". The concepts of this paper apply to most automatic test equipment (ATE).