Title :
Looking around with your brain in a virtual world
Author :
Bos, Danny Plass-Oude ; Duvinage, Matthieu ; Oktay, Oytun ; Saa, Jaime Delgado ; Guruler, Huseyin ; Istanbullu, Ayhan ; Van Vliet, Marijn ; van de Laar, Bram ; Poel, Mannes ; Roijendijk, Linsey ; Tonin, Luca ; Bahramisharif, Ali ; Reuderink, Boris
Author_Institution :
HMI Group, Univ. of Twente, Enschede, Netherlands
Abstract :
Offline analysis pipelines have been developed and evaluated for the detection of covert attention from electroen-cephalography recordings, and the detection of overt attention in terms of eye movement based on electrooculographic measurements. Some additional analysis were done in order to prepare the pipelines for use in a real-time system. This real-time system and a game application in which these pipelines are to be used were implemented. The game is set in a virtual environment where player is a wildlife photographer on an uninhabited island. Overt attention is used to adjust the angle of the first person camera, when the player is tracking animals. When making a photograph, the animal will flee when it notices it is looked at directly, so covert attention is required to get a good shot. Future work will entail user tests with this system to evaluate usability, user experience, and characteristics of the signals related to overt and covert attention when used in such an immersive environment.
Keywords :
brain-computer interfaces; electroencephalography; virtual reality; brain computer interface; covert attention; electroencephalography recording; electrooculographic measurement; eye movement; offline analysis pipelines; real-time system; virtual environment; virtual world; wildlife photographer; Accuracy; Electrodes; Electroencephalography; Electrooculography; Games; Pipelines; Training; Multimodal interaction; brain-computer interfacing; covert attention; electroencephalography; electrooculography; eye tracking; virtual environment;
Conference_Titel :
Computational Intelligence, Cognitive Algorithms, Mind, and Brain (CCMB), 2011 IEEE Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-9890-1
DOI :
10.1109/CCMB.2011.5952110