Title :
A framework on software fault localization: Variable Stress Reaction
Author :
Nie, Peng ; Geng, Ji ; Qin, Zhiguang
Author_Institution :
Sch. of Comput. Sci. & Eng., Univ. of Electron. Sci. & Technol., Chengdu, China
Abstract :
Since automated fault localization can improve the efficiency of both the testing and debugging process, it comes to an indispensable part of high security and reliable software development for the computer networks. A novel software fault localization framework: Variable Stress Reaction (VSR) is proposed in this paper, which works well for data type overflow detection. The experimental results show that our approach has the potential to be effective in localizing the faults for software.
Keywords :
computer networks; program debugging; program testing; security of data; software fault tolerance; computer networks; data type overflow detection; debugging process; security; software development reliability; software fault localization; testing process; variable stress reaction; Arrays; Java; Law; Software; Software engineering; Stress; Syntactics;
Conference_Titel :
Communications, Circuits and Systems (ICCCAS), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8224-5
DOI :
10.1109/ICCCAS.2010.5582003
