• DocumentCode
    2270417
  • Title

    Building an automated test system using modular signal sources and digitizers

  • Author

    Lauterbach, Dr Michael J

  • Author_Institution
    LeCroy Corp., Chestnut Ridge, NY, USA
  • fYear
    2003
  • fDate
    22-25 Sept. 2003
  • Firstpage
    72
  • Lastpage
    76
  • Abstract
    Basic methods and practical advice concerning the use of modular arbitrary waveform generators (AWGs) and digitizers is given in this article. Emphasis is on the use of modular instruments conforming to the PXI standard, though some contrast is also made to a related standard, compactPCI. Of note is the capability of new modular AWG´s to create very precise stimulus signals using 14 bit vertical resolution combined with 10 digit sample clock frequency resolution and the ability for high speed digitizers to capture signals up to 500 MHz bandwidth using 50 GS/s equivalent time sampling for repetitive test signals.
  • Keywords
    analogue-digital conversion; automatic test equipment; function generators; 500 MHz; ATE; AWG; PXI standard; arbitrary waveform generators; automated test system; compactPCI standard; high speed modular digitizers; modular signal sources; repetitive test signals; sample clock frequency resolution; stimulus signals generation; Automatic testing; Bandwidth; Clocks; Costs; Frequency synchronization; Instruments; Signal generators; Signal resolution; System testing; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-7837-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.2003.1243557
  • Filename
    1243557