DocumentCode
2270417
Title
Building an automated test system using modular signal sources and digitizers
Author
Lauterbach, Dr Michael J
Author_Institution
LeCroy Corp., Chestnut Ridge, NY, USA
fYear
2003
fDate
22-25 Sept. 2003
Firstpage
72
Lastpage
76
Abstract
Basic methods and practical advice concerning the use of modular arbitrary waveform generators (AWGs) and digitizers is given in this article. Emphasis is on the use of modular instruments conforming to the PXI standard, though some contrast is also made to a related standard, compactPCI. Of note is the capability of new modular AWG´s to create very precise stimulus signals using 14 bit vertical resolution combined with 10 digit sample clock frequency resolution and the ability for high speed digitizers to capture signals up to 500 MHz bandwidth using 50 GS/s equivalent time sampling for repetitive test signals.
Keywords
analogue-digital conversion; automatic test equipment; function generators; 500 MHz; ATE; AWG; PXI standard; arbitrary waveform generators; automated test system; compactPCI standard; high speed modular digitizers; modular signal sources; repetitive test signals; sample clock frequency resolution; stimulus signals generation; Automatic testing; Bandwidth; Clocks; Costs; Frequency synchronization; Instruments; Signal generators; Signal resolution; System testing; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN
1080-7725
Print_ISBN
0-7803-7837-7
Type
conf
DOI
10.1109/AUTEST.2003.1243557
Filename
1243557
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