• DocumentCode
    2270502
  • Title

    W-band noise figure measurement designed for on-wafer characterisation

  • Author

    Drury, R. ; Pollard, R.D. ; Snowden, C.M.

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Leeds Univ., UK
  • Volume
    3
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    1273
  • Abstract
    The first fully automated noise and S-parameter measurement bench is reported for W-band on-wafer characterisation. A calibration procedure is described that allows the receiver reference plane to be accurately moved to the probe tip.
  • Keywords
    MIMIC; S-parameters; calibration; electric noise measurement; integrated circuit measurement; millimetre wave measurement; probes; MIMICs; S-parameter measurement; W-band; calibration procedure; noise figure measurement; on-wafer characterisation; probe tip; receiver reference plane; Acoustic reflection; Calibration; Measurement techniques; Noise figure; Noise measurement; Probes; Scattering parameters; Switches; Temperature; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.512168
  • Filename
    512168
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2270502