DocumentCode :
2270586
Title :
Vector corrected on-wafer power measurements of frequency converting two-ports
Author :
Roth, B. ; Kother, D. ; Sporkmann, T. ; Lutke, W. ; Wolff, I.
Author_Institution :
Inst. fur Mobil- und Satellitenfunktechnik, Kamp-Lintfort, Germany
Volume :
3
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
1281
Abstract :
In this paper a universal nonlinear measurement system is presented. The On-Wafer approach described here is commercially available and utilizes a modified vectorial network analyzer (Wiltron 360 B) and a special software package developed at the IMST. The system determines the complex quantities of all power waves at all ports of the DUT. Since measurements are carried out at all interesting harmonics, the system is ideal for the complete electrical characterization of a frequency multiplier for instance. In contrast to other power and harmonic measurement approaches using VNAs, the technique proposed here does not need an additional microwave synthesizer for locking the receiver to the harmonics. The described system exhibits a power sweep range of more than 80 dB.
Keywords :
frequency multipliers; harmonics; microwave measurement; millimetre wave measurement; network analysers; power measurement; two-port networks; DUT; electrical characterization; frequency converting two-ports; frequency multiplier; harmonics; on-wafer power measurements; power sweep range; software package; universal nonlinear measurement system; vector corrected measurements; vectorial network analyzer; Circuits; Frequency conversion; Frequency measurement; Instruments; Power measurement; Power system harmonics; Scattering parameters; Spectral analysis; Synthesizers; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3246-6
Type :
conf
DOI :
10.1109/MWSYM.1996.512170
Filename :
512170
Link To Document :
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