Abstract :
The following topics are dealt with: high level circuit design validation and test; multiprocessors; post-silicon validation; test generation; formal verification; coverage directed validation; multi-core design; and embedded systems.
Keywords :
circuit testing; high level synthesis; multiprocessing systems; coverage directed validation; embedded systems; formal verification; high level circuit design validation; multi-core design; multiprocessors; post-silicon validation; test generation;
Conference_Titel :
High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International
Conference_Location :
Irvine, CA
Print_ISBN :
978-1-4244-1480-2
DOI :
10.1109/HLDVT.2007.4392773
