Keynote

fYear

2007

fDate

7-9 Nov. 2007

Keywords

Emulation; Engineering management; Microcontrollers; Microprocessors; Parallel processing; Silicon; Software development management; Software tools;

fLanguage

English

Publisher

ieee

Conference_Titel

High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International

Conference_Location

Irvine, CA, USA

ISSN

1552-6674

Print_ISBN

978-1-4244-1480-2

Type

conf

DOI

10.1109/HLDVT.2007.4392775

Filename

4392775

Link To Document