Title :
Techniques to enable FPGA based reconfigurable fault tolerant space computing
Author :
Smith, Grant L. ; De la Torre, Lou
Author_Institution :
Defense & Space Electron. Syst., Honeywell Inc., North Clearwater, FL
Abstract :
Reconfigurable computing using field programmable gate arrays (FPGAs) offer significant performance improvements over traditional space based processing solutions. The application of commercial-off-the-shelf (COTS) FPGA processing components requires radiation-effect detection and mitigation strategy to compensate for the FPGAs´ susceptibility to single event upsets (SEUs) and single event functional interrupts (SEFIs). A reconfigurable computing architecture that uses external triple modular redundancy (TMR) via a radiation-hardened ASIC provides the most robust approach to SEU and SEFI detection and mitigation. Honeywell has designed a TMR Voter ASIC with an integrated FPGA configuration manager that can automatically reconfigure an upset FPGA upon TMR error detection. The automatic configuration manager also has features to support resynchronizing the upset FPGA with the remaining two FPGAs operating in a self checking pair (SCP) mode. Automating and minimizing reconfiguration times and re synchronization times enables high performance FPGA-based processors to provide high system availability with minimal software/system controller intervention
Keywords :
aerospace computing; fault tolerant computing; field programmable gate arrays; radiation effects; reconfigurable architectures; FPGA-based processors; TMR Voter ASIC; commercial-off-the-shelf processing components; error detection; fault tolerant space computing; field programmable gate arrays; radiation-effect detection; radiation-hardened ASIC; reconfigurable computing; single event functional interrupts; single event upsets; software/system controller; space based processing solutions; triple modular redundancy; Application specific integrated circuits; Computer architecture; Event detection; Fault tolerance; Field programmable gate arrays; Radiation detectors; Redundancy; Robustness; Single event transient; Single event upset;
Conference_Titel :
Aerospace Conference, 2006 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
0-7803-9545-X
DOI :
10.1109/AERO.2006.1655958