Title :
Radiation tolerant mixed signal microcontroller for Martian surface applications
Author :
Fraeman, Martin E. ; Meitzler, Richard C. ; Martin, Mark N. ; Millard, Wesley P. ; Wong, Yanyi L. ; Mellert, Joanna D. ; Bowles-Martinez, Jessica N. ; Strohbehn, Kim ; Roth, David R.
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD
Abstract :
We are developing a radiation tolerant, mixed-signal microcontroller for applications exposed to the Martian surface thermal environment. The part can be used for spacecraft/rover engineering data collection, parameter monitoring, and fault detection at the sensor and needs minimal external support circuits. The 8-bit microcontroller includes timer resources, three serial communications ports, a 16-bit programmable digital interface, an 8-level interrupt controller, and I 2C master/slave bus interface. Mixed signal peripherals include a 16-channel, 10-bit successive approximation A/D converter, 10-bit D/A converter, programmable gain amplifier, and voltage reference. All memory interfaces use a 13-bit wide two-bit error detection, single-bit error correction code for each byte. There is an internal 512 times 13 bit scratchpad static random access memory and 2 Ki times 13 bit electrically erasable programmable read only memory
Keywords :
aerospace instrumentation; analogue-digital conversion; microcontrollers; planetary rovers; radiation hardening; A/D converter; D/A converter; I2C master/slave bus interface; Martian surface thermal environment; error correction; error detection; fault detection; interrupt controller; mixed signal peripherals; mixed-signal microcontroller; parameter monitoring; programmable digital interface; programmable gain amplifier; programmable read only memory; radiation tolerant microcontroller; scratchpad static random access memory; sensor; serial communications ports; spacecraft/rover engineering data collection; voltage reference; Aerospace engineering; Circuits; Communication system control; Condition monitoring; Data engineering; Electrical fault detection; Error correction codes; Master-slave; Microcontrollers; Space vehicles;
Conference_Titel :
Aerospace Conference, 2006 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
0-7803-9545-X
DOI :
10.1109/AERO.2006.1655963