• DocumentCode
    2270908
  • Title

    Challenges in post-silicon verification of IBM’s Cell/B.E. and other game processors

  • Author

    Kapoor, Shakti

  • Author_Institution
    IBM Austin, Austin
  • fYear
    2007
  • fDate
    7-9 Nov. 2007
  • Firstpage
    48
  • Lastpage
    52
  • Abstract
    Recent IBM processors used in various computer systems including gaming systems are a very aggressive design, addressing three main challenges of the processor design -Memory wall, Power wall and ILP wall. To break these walls the some designs utilized multi threaded, multi core and yet high frequency. These kinds of designs increased the complexity of the test stream generation for processor verification especially in a stress test environment. Moreover Cell Broadband Engine TM (Cell/B.E.) utilizes heterogeneous multi core, multi threaded with high. This further increased the complexity of the verification. This paper describes some of the scenarios, the Post Silicon Verification team addressed in their effort of verification of the Cell/B.E. and other game processors.
  • Keywords
    logic testing; microprocessor chips; multi-threading; system-on-chip; IBM´s Cell/B.E; ILP wall; SOC; game processor; memory wall; multithreading; post-silicon verification; power wall; processor verification; Engines; Frequency; Hardware; Logic testing; Multithreading; Process design; Random access memory; Silicon; Stress; Yarn; ABIST; Blue Gene-P; Broadway; CPU; Cache Coherency; CellB.E.™; Controller; DMA; DRAM; FPU; LBIST; LPAR; MFC; NUMA; PLAYSTATION®3; PPE; Post; Post Execution Error Checking; SIMD; SPE; Silicon Verification; Simultaneous Multithreading; TLB; Xbox 360™;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International
  • Conference_Location
    Irvine, CA
  • ISSN
    1552-6674
  • Print_ISBN
    978-1-4244-1480-2
  • Type

    conf

  • DOI
    10.1109/HLDVT.2007.4392785
  • Filename
    4392785