DocumentCode
2270908
Title
Challenges in post-silicon verification of IBM’s Cell/B.E. and other game processors
Author
Kapoor, Shakti
Author_Institution
IBM Austin, Austin
fYear
2007
fDate
7-9 Nov. 2007
Firstpage
48
Lastpage
52
Abstract
Recent IBM processors used in various computer systems including gaming systems are a very aggressive design, addressing three main challenges of the processor design -Memory wall, Power wall and ILP wall. To break these walls the some designs utilized multi threaded, multi core and yet high frequency. These kinds of designs increased the complexity of the test stream generation for processor verification especially in a stress test environment. Moreover Cell Broadband Engine TM (Cell/B.E.) utilizes heterogeneous multi core, multi threaded with high. This further increased the complexity of the verification. This paper describes some of the scenarios, the Post Silicon Verification team addressed in their effort of verification of the Cell/B.E. and other game processors.
Keywords
logic testing; microprocessor chips; multi-threading; system-on-chip; IBM´s Cell/B.E; ILP wall; SOC; game processor; memory wall; multithreading; post-silicon verification; power wall; processor verification; Engines; Frequency; Hardware; Logic testing; Multithreading; Process design; Random access memory; Silicon; Stress; Yarn; ABIST; Blue Gene-P; Broadway; CPU; Cache Coherency; CellB.E.™; Controller; DMA; DRAM; FPU; LBIST; LPAR; MFC; NUMA; PLAYSTATION®3; PPE; Post; Post Execution Error Checking; SIMD; SPE; Silicon Verification; Simultaneous Multithreading; TLB; Xbox 360™;
fLanguage
English
Publisher
ieee
Conference_Titel
High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International
Conference_Location
Irvine, CA
ISSN
1552-6674
Print_ISBN
978-1-4244-1480-2
Type
conf
DOI
10.1109/HLDVT.2007.4392785
Filename
4392785
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