Bug analysis and corresponding error models in real designs

Author

Lv, Tao ; Xu, Tong ; Zhao, Yang ; Li, Huawei ; Li, Xiaowei

Author_Institution

Chinese Acad. of Sci., Beijing

fYear

2007

fDate

7-9 Nov. 2007

Firstpage

59

Lastpage

64

Abstract

This paper presents the item-missing error model. It stems from the analysis of real bugs that are collected in two market-oriented projects: (1) the AMBA interface of a general-purpose microprocessor IP core; (2) a wireless sensor network oriented embedded processor. The bugs are analyzed via code structure comparison, and it is found that item-missing errors merit attention. The test generation method for item-missing error model is proposed. Structural information obtained from this error model is helpful to reach a greater probability of bug detection than that in random-generation verification with only functional constraints. Finally, the proposed test method is applied in verification of our designs, and experimental results demonstrate the effectiveness of this method.

Keywords

error analysis; industrial property; microprocessor chips; probability; program debugging; program verification; wireless sensor networks; AMBA interface; bug analysis; bug detection probability; embedded processor; item-missing error model; microprocessor IP core; random-generation verification; wireless sensor network; Automatic test pattern generation; Circuit faults; Circuit testing; Computer architecture; Computer bugs; Computer errors; Error analysis; Genetic mutations; Laboratories; Microprocessors; error models; item-missing bugs; simulation-based validation; test generation;

fLanguage

English

Publisher

ieee

Conference_Titel

High Level Design Validation and Test Workshop, 2007. HLVDT 2007. IEEE International

Conference_Location

Irvine, CA

ISSN

1552-6674

Print_ISBN

978-1-4244-1480-2

Type

conf

DOI

10.1109/HLDVT.2007.4392788

Filename

4392788