Foreword

On behalf of the organizing committee, we would like to welcome you to the 2012 International Symposium on VLSI Design, Automation, and Test (2012 VLSI-DAT). As in the past seven years, the Symposium carries on its mission to bring together industry and academic experts to exchange and disseminate their latest R&D findings and accomplishments. The scope of the work presented at the Symposium spans from advanced analog/mixed-signal/RF and SoC design to design automation, testing and manufacturability. The Symposium continues to provide a dynamic environment and synergistic setting for researchers from all over the world to discuss the most current progress with the Taiwan´s local experts. This year, along with its sister conference, the Symposium features one joint plenary session and two joint topic sessions. VLSI-DAT itself features two plenary talks, one special talk, two special topic sessions, two invited industrial sessions, 14 technical sessions and one poster session.