Dependence of simulated ECT signal on defect conductivity

This paper presents a numerical study of the influence of a conductive defect of arbitrary width on the eddy current testing signals. The fast-forward FEM-BEM analysis solver using database is adopted for the signal simulation. The algorithm of database used here is designed for a three-dimensional defect region, and not for a two-dimensional one, with a given defect width, as usually. Thus, the signals can be simulated for a conductive defect with different widths, using the same database generated in advance. The simulated signals due to conductive defects are analyzed for various widths and conductivities in order to find the features of the signals.